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A memristor array has emerged as a potential computing hardware for artificial intelligence (AI). It has an inherent memory effect that allows information storage in the form of easily programmable electrical conductance, making it suitable for efficient data processing without shuttling of data between the processor and memory. To realize its full potential for AI applications, fine-tuning of internal device dynamics is required to implement a network system that employs dynamic functions. Here, we provide a perspective on multicationic entropy-stabilized oxides as a widely tunable materials system for memristor applications. We highlight the potential for efficient data processing in machine learning tasks enabled by the implementation of “task specific” neural networks that derive from this material tunability. 

Analog compute‐in‐memory (CIM) systems are promising candidates for deep neural network (DNN) inference acceleration. However, as the use of DNNs expands, protecting user input privacy has become increasingly important. Herein, a potential security vulnerability is identified wherein an adversary can reconstruct the user's private input data from a power side‐channel attack even without knowledge of the stored DNN model. An attack approach using a generative adversarial network is developed to achieve high‐quality data reconstruction from power leakage measurements. The analyses show that the attack methodology is effective in reconstructing user input data from power leakage of the analog CIM accelerator, even at large noise levels and after countermeasures. To demonstrate the efficacy of the proposed approach, an example of CIM inference of U‐Net for brain tumor detection is attacked, and the original magnetic resonance imaging medical images can be successfully reconstructed even at a noise level of 20% standard deviation of the maximum power signal value. This study highlights a potential security vulnerability in emerging analog CIM accelerators and raises awareness of needed safety features to protect user privacy in such systems. 

Electronic switches based on the migration of high-density point defects, or memristors, are poised to revolutionize post-digital electronics. Despite significant research, key mechanisms for filament formation and oxygen transport remain unresolved, hindering our ability to predict and design device properties. For example, experiments have achieved 10 orders of magnitude longer retention times than predicted by current models. Here, using electrical measurements, scanning probe microscopy, and first-principles calculations on tantalum oxide memristors, we reveal that the formation and stability of conductive filaments crucially depend on the thermodynamic stability of the amorphous oxygen-rich and oxygen-poor compounds, which undergo composition phase separation. Including the previously neglected effects of this amorphous phase separation reconciles unexplained discrepancies in retention and enables predictive design of key performance indicators such as retention stability. This result emphasizes non-ideal thermodynamic interactions as key design criteria in post-digital devices with defect densities substantially exceeding those of today’s covalent semiconductors.